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Heterogeneous integration of InAs/GaSb tunnel diode structure on silicon using 200 nm GaAsSb dislocation filtering buffer

An InAs/GaSb tunnel diode structure was heterogeneously integrated on silicon by solid source molecular beam epitaxy using a 200 nm strained GaAs1-ySby dislocation filtering buffer. X-ray analysis demonstrated near complete strain relaxation of the metamorphic buffer and a quasi-lattice-matched InAs...

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Detaylı Bibliyografya
Asıl Yazarlar: J.-S. Liu, M. Clavel, R. Pandey, S. Datta, Y. Xie, J. J. Heremans, M. K. Hudait
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: AIP Publishing LLC 2018-10-01
Seri Bilgileri:AIP Advances
Online Erişim:http://dx.doi.org/10.1063/1.5042064
Etiketler: Etiketle
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