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Transparent memory tests with even repeating addresses for storage devices
The urgency of the problem of memory testing of modern computing systems is shown. Mathematical models describing the faulty states of storage devices and the methods used for their detection are investigated. The concept of address sequences (pA) with an even repetition of addresses is introduced,...
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| Main Authors: | , , , |
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| Formato: | Artigo |
| Idioma: | Russo |
| Publicado em: |
The United Institute of Informatics Problems of the National Academy of Sciences of Belarus
2021-09-01
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| Colecção: | Informatika |
| Assuntos: | |
| Acesso em linha: | https://inf.grid.by/jour/article/view/1137 |
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