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Using Machine Learning Classifiers to Recognize the Mixture Control Chart Patterns for a Multiple-Input Multiple-Output Process
A statistical process control (SPC) chart is one of the most important techniques for monitoring a process. Typically, a certain root cause or a disturbance in a process would result in the presence of a systematic control chart pattern (CCP). Consequently, the effective recognition of CCPs has rece...
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Main Authors: | , |
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Formato: | Artigo |
Idioma: | Inglês |
Publicado em: |
MDPI AG
2020-01-01
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Colecção: | Mathematics |
Assuntos: | |
Acesso em linha: | https://www.mdpi.com/2227-7390/8/1/102 |
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