Nalaganje...

Simultaneous imaging of the ferromagnetic and ferroelectric structure in multiferroic heterostructures

By measuring the spin polarization of secondary electrons and the intensity of backscattered electrons generated in a scanning electron microscope, we are able to simultaneously image the ferromagnetic domain structure of a ferromagnetic thin film and the ferroelectric domain structure of the underl...

Popoln opis

Shranjeno v:
Bibliografske podrobnosti
Main Authors: J. Unguris, S. R. Bowden, D. T. Pierce, M. Trassin, R. Ramesh, S.-W. Cheong, S. Fackler, I. Takeuchi
Format: Artigo
Jezik:Inglês
Izdano: AIP Publishing LLC 2014-07-01
Serija:APL Materials
Online dostop:http://dx.doi.org/10.1063/1.4890055
Oznake: Označite
Brez oznak, prvi označite!