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Simultaneous imaging of the ferromagnetic and ferroelectric structure in multiferroic heterostructures
By measuring the spin polarization of secondary electrons and the intensity of backscattered electrons generated in a scanning electron microscope, we are able to simultaneously image the ferromagnetic domain structure of a ferromagnetic thin film and the ferroelectric domain structure of the underl...
保存先:
| 主要な著者: | , , , , , , , |
|---|---|
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
AIP Publishing LLC
2014-07-01
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| シリーズ: | APL Materials |
| オンライン･アクセス: | http://dx.doi.org/10.1063/1.4890055 |
| タグ: |
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