Characterization of MHz pulse repetition rate femtosecond laser-irradiated gold-coated silicon surfaces

<p>Abstract</p> <p>In this study, MHz pulse repetition rate femtosecond laser-irradiated gold-coated silicon surfaces under ambient condition were characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction analysis (XRD), and X-ra...

Celý popis

Uloženo v:
Podrobná bibliografie
Hlavní autoři: Venkatakrishnan Krishnan, Sivakumar Manickam, Tan Bo
Médium: Artigo
Jazyk:Inglês
Vydáno: SpringerOpen 2011-01-01
Edice:Nanoscale Research Letters
On-line přístup:http://www.nanoscalereslett.com/content/6/1/78
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!

Podobné jednotky