Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM

Focused-electron-beam-induced deposition (FEBID) is used as a direct-write approach to decorate ultrasmall Pt nanoclusters on carbon nanotubes at selected sites in a straightforward maskless manner. The as-deposited nanostructures are studied by transmission electron microscopy (TEM) in 2D and 3D, d...

Descrizione completa

Salvato in:
Dettagli Bibliografici
Autori principali: Xiaoxing Ke, Carla Bittencourt, Sara Bals, Gustaaf Van Tendeloo
Natura: Artigo
Lingua:Inglês
Pubblicazione: Beilstein-Institut 2013-02-01
Serie:Beilstein Journal of Nanotechnology
Soggetti:
carbon nanotubes
FEBID
nanocluster
platinum
patterning
radiation-induced nanostructures
TEM
Accesso online:https://doi.org/10.3762/bjnano.4.9
Tags: Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne! !

Documenti analoghi