Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM

Focused-electron-beam-induced deposition (FEBID) is used as a direct-write approach to decorate ultrasmall Pt nanoclusters on carbon nanotubes at selected sites in a straightforward maskless manner. The as-deposited nanostructures are studied by transmission electron microscopy (TEM) in 2D and 3D, d...

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שמור ב:
מידע ביבליוגרפי
Main Authors: Xiaoxing Ke, Carla Bittencourt, Sara Bals, Gustaaf Van Tendeloo
פורמט: Artigo
שפה:Inglês
יצא לאור: Beilstein-Institut 2013-02-01
סדרה:Beilstein Journal of Nanotechnology
נושאים:
carbon nanotubes
FEBID
nanocluster
platinum
patterning
radiation-induced nanostructures
TEM
גישה מקוונת:https://doi.org/10.3762/bjnano.4.9
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