Modelling and Measuring Dielectric Constants for Very Thin Materials Using a Coaxial Probe

This paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1 mm – 0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were appl...

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Main Authors: K. Y. You, Z. Abbas, C.Y. Lee, M. F. A. Malek, K. Y. Lee, E. M. Cheng
Formato: Artigo
Idioma:Inglês
Publicado em: Spolecnost pro radioelektronicke inzenyrstvi 2014-12-01
Colecção:Radioengineering
Assuntos:
Relative effective permittivity
one-port calibration
measured reflection coefficient
open-ended coaxial probe
thin dielectric substrate
Acesso em linha:http://www.radioeng.cz/fulltexts/2014/14_04_1016_1025.pdf
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