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Surface Defect System for Long Product Manufacturing Using Differential Topographic Images

Current industrial products must meet quality requirements defined by international standards. Most commercial surface inspection systems give qualitative detections after a long, cumbersome and very expensive configuration process made by the seller company. In this paper, a new surface defect dete...

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Main Authors: F.J. delaCalle Herrero, Daniel F. García, Rubén Usamentiaga
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI AG 2020-04-01
Colecção:Sensors
Assuntos:
Acesso em linha:https://www.mdpi.com/1424-8220/20/7/2142
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