Topaz, a Potential Volatile-Carrier in Cold Subduction Zone: Constraint from Synchrotron X-Ray Diffraction and Raman Spectroscopy at High Temperature and High Pressure

The equation of state and stability of topaz at high-pressure/high-temperature conditions have been investigated by in situ synchrotron X-ray diffraction (<i>XRD</i>) and Raman spectroscopy in this study. No phase transition occurs on topaz over the experimental pressure–temperature (<...

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Bibliografiset tiedot
Päätekijät: Shijie Huang, Jingui Xu, Chunfa Chen, Bo Li, Zhilin Ye, Wei Chen, Yunqian Kuang, Dawei Fan, Wenge Zhou, Maining Ma
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: MDPI AG 2020-09-01
Sarja:Minerals
Aiheet:
topaz
high temperature
high pressure
Synchrotron X-ray diffraction
Raman spectroscopy
Linkit:https://www.mdpi.com/2075-163X/10/9/780
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