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Genome Wide Association Study of Karnal Bunt Resistance in a Wheat Germplasm Collection from Afghanistan

Karnal bunt disease of wheat, caused by the fungus <i>Neovossia indica</i>, is one of the most important challenges to the grain industry as it affects the grain quality and also restricts the international movement of infected grain. It is a seed-, soil- and airborne disease with limite...

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Main Authors: Vikas Gupta, Xinyao He, Naresh Kumar, Guillermo Fuentes-Davila, Rajiv K. Sharma, Susanne Dreisigacker, Philomin Juliana, Najibeh Ataei, Pawan K. Singh
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI AG 2019-06-01
Colecção:International Journal of Molecular Sciences
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Acesso em linha:https://www.mdpi.com/1422-0067/20/13/3124
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