A Review on Experimental Measurements for Understanding Efficiency Droop in InGaN-Based Light-Emitting Diodes

Efficiency droop in GaN-based light emitting diodes (LEDs) under high injection current density perplexes the development of high-power solid-state lighting. Although the relevant study has lasted for about 10 years, its mechanism is still not thoroughly clear, and consequently its solution is also...

Descripció completa

Guardat en:
Dades bibliogràfiques
Autors principals: Lai Wang, Jie Jin, Chenziyi Mi, Zhibiao Hao, Yi Luo, Changzheng Sun, Yanjun Han, Bing Xiong, Jian Wang, Hongtao Li
Format: Artigo
Idioma:Inglês
Publicat: MDPI AG 2017-10-01
Col·lecció:Materials
Matèries:
light-emitting diodes (LEDs)
efficiency droop
GaN
InGaN
multiple quantum wells (MQWs)
carrier lifetime
Accés en línia:https://www.mdpi.com/1996-1944/10/11/1233
Etiquetes: Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!

Ítems similars