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Kohonen’s algorithm in problems of classification of defects in printed circuit assemblies

The article presents a new method for diagnosing the technical condition of radio-electronic components, combining the methods of thermal diagnostics with the technologies of artificial neural networks. The structure of the method is shown, and the composition of the functional blocks is determined....

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Detalhes bibliográficos
Main Authors: S. U. Uvaysov, V. V. Chernoverskaya, An Kuan Dao, Van Tuan Nguyen
Formato: Artigo
Idioma:Russo
Publicado em: MIREA - Russian Technological University 2021-08-01
Colecção:Российский технологический журнал
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Acesso em linha:https://www.rtj-mirea.ru/jour/article/view/348
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