Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks

In this study, a deep learning algorithm based on the you-only-look-once (YOLO) approach is proposed for the quality inspection of printed circuit boards (PCBs). The high accuracy and efficiency of deep learning algorithms has resulted in their increased adoption in every field. Similarly, accurate...

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Główni autorzy: Venkat Anil Adibhatla, Huan-Chuang Chih, Chi-Chang Hsu, Joseph Cheng, Maysam F. Abbod, Jiann-Shing Shieh
Format: Artigo
Język:Inglês
Wydane: MDPI AG 2020-09-01
Seria:Electronics
Hasła przedmiotowe:
convolution neural network
YOLO
deep learning
printed circuit board
Dostęp online:https://www.mdpi.com/2079-9292/9/9/1547
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