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An Approach for Measuring the Dielectric Strength of OLED Materials
Surface roughness of electrodes plays a key role in the dielectric breakdown of thin-film organic devices. The rate of breakdown will increase when there are stochastic sharp spikes on the surface of electrodes. Additionally, surface having spiking morphology makes the determination of dielectric st...
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| Main Authors: | , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI AG
2018-06-01
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| Colecção: | Materials |
| Assuntos: | |
| Acesso em linha: | http://www.mdpi.com/1996-1944/11/6/979 |
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