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Reliability of semiconductor and gas-filled diodes for over-voltage protection exposed to ionizing radiation

The wide-spread use of semiconductor and gas-filled diodes for non-linear over-voltage protection results in a variety of possible working conditions. It is therefore essential to have a thorough insight into their reliability in exploitation environments which imply exposure to ionizing radiation....

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Bibliografske podrobnosti
Main Authors: Stanković Koviljka, Vujisić Miloš, Dolićanin Edin
Format: Artigo
Jezik:Inglês
Izdano: VINCA Institute of Nuclear Sciences 2009-01-01
Serija:Nuclear Technology and Radiation Protection
Teme:
Online dostop:http://www.doiserbia.nb.rs/img/doi/1451-3994/2009/1451-39940902132S.pdf
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