SEC-BADAEC: An Efficient ECC With No Vacancy for Strong Memory Protection
Shrinking process technology and rising memory densities have made memories increasingly vulnerable to errors. Accordingly, DRAM vendors have introduced <italic>On-die Error Correction Code (O-ECC)</italic> to protect data against the growing number of errors. Current O-ECC provides weak <italic>Sin...
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| Principais autores: | , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
IEEE
2022-01-01
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| Series: | IEEE Access |
| Assuntos: | |
| Acceso en liña: | https://ieeexplore.ieee.org/document/9866743/ |
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