Algorithmic Optimization of Star-Mesh Quantized Hall Resistance Networks for Bridge Sensitivity

Contemporary advances in electrical metrology include the understanding and development of star-mesh transformations and their applicability to the access of very high quantized resistances. These pursuits seek to drastically reduce the traceability chain for global calibrations, as demonstrated by...

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Hlavní autoři:	Gretchen B. Ferguson, Albert F. Rigosi, Dominick S. Scaletta, David B. Newell, Dean G. Jarrett
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	IEEE 2026-01-01
Edice:	IEEE Open Journal of Instrumentation and Measurement
Témata:	Calibration electrical resistance measurement quantum Hall effect resistance standards
On-line přístup:	https://ieeexplore.ieee.org/document/11594103/
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