Validation of High-Availability Model for Edge Devices and IIoT

Competitiveness in industry requires smooth, efficient, and high-quality operation. For some industrial applications or process control and monitoring applications, it is necessary to achieve high availability and reliability because, for example, the failure of availability in industrial production...

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Principais autores:	Peter Peniak, Emília Bubeníková, Alžbeta Kanáliková
格式:	Artigo
語言:	Inglês
出版:	MDPI AG 2023-05-01
叢編:	Sensors
主題:	Edge model Edge device OPC UA protocol MQTT protocol high availability model
在線閱讀:	https://www.mdpi.com/1424-8220/23/10/4871
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