Shallow carrier traps in hydrothermal ZnO crystals
Native and hydrogen-plasma induced shallow traps in hydrothermally grown ZnO crystals have been investigated by charge-based deep level transient spectroscopy, photoluminescence and cathodoluminescence microanalysis. The as-grown ZnO exhibits a trap state at 23 meV, while H-doped ZnO produced by pla...
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| Glavni autori: | , , , , , , , |
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| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
IOP Publishing
2014-01-01
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| Serija: | New Journal of Physics |
| Teme: | |
| Online pristup: | https://doi.org/10.1088/1367-2630/16/8/083040 |
| Oznake: |
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