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Tuning the electronic properties of defect-rich MoS2

Transition metal dichalcogenides (TMDCs), including molybdenum disulfide (MoS2), have emerged as a promising candidate for novel semiconducting devices. However, in many cases structural defects significantly affect the electronic properties of the material. The present study utilizes angle-resolved...

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Principais autores: Eric Juriatti, Martina Binninger, Carolin Schüle, Maren Zirwick, Katarina Margetic, Erika Giangrisostomi, Marcus Scheele, Heiko Peisert
Formato: Artigo
Idioma:Inglês
Publicado em: Beilstein-Institut 2026-06-01
coleção:Beilstein Journal of Nanotechnology
Assuntos:
angle-resolved photoelectron spectroscopy (arpes)
mos2
phthalocyanine
x-ray absorption spectroscopy (xas)
x-ray photoelectron spectroscopy (xps)
Acesso em linha:https://doi.org/10.3762/bjnano.17.56
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