Quantum metrology in the presence of limited data
Quantum metrology protocols are typically designed around the assumption that we have an abundance of measurement data, but recent practical applications are increasingly driving interest in cases with very limited data. In this regime the best approach involves an interesting interplay between the...
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| Hlavní autoři: | , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
IOP Publishing
2019-01-01
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| Edice: | New Journal of Physics |
| Témata: | |
| On-line přístup: | https://doi.org/10.1088/1367-2630/ab098b |
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