Ultrafast Interfacial Charge Transfer Initiates Mechanical Stress and Heat Transport at the Au‐TiO2 Interface

Abstract Metal‐semiconductor interfaces are crucial components of optoelectronic and electrical devices, the performance of which hinges on intricate dynamics involving charge transport and mechanical interaction at the interface. Nevertheless, structural changes upon photoexcitation and subsequent...

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Autores principales:	Jun Heo, Alekos Segalina, Doyeong Kim, Doo‐Sik Ahn, Key Young Oang, Sungjun Park, Hyungjun Kim, Hyotcherl Ihee
Formato:	Artigo
Lenguaje:	Inglês
Publicado:	Wiley 2024-09-01
Colección:	Advanced Science
Materias:	hot carrier dynamics interfacial charge transfer interfacial coupling metal‐semiconductor interface ultrafast electron diffraction ultrafast heat transfer
Acceso en línea:	https://doi.org/10.1002/advs.202400919
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