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Fully Relaxed, Crack-Free AlGaN with upto 50% Al Composition Grown on Porous GaN Pseudo-Substrate

Fully relaxed, crack free, smooth Al<sub>x</sub>Ga<sub>1−x</sub>N layers with up to 50% Al composition were demonstrated on pseudo-substrates composed of dense arrays of 10 × 10 µm<sup>2</sup> compliant porous GaN-on-porous-GaN tiles. The AlGaN layers were grown in steps for a total of 1.3 µm. The g...

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Autores principales: Nirupam Hatui, Henry Collins, Emmanuel Kayede, Shubhra S. Pasayat, Weiyi Li, Stacia Keller, Umesh K. Mishra
Formato: Artigo
Lenguaje:Inglês
Publicado: MDPI AG 2022-07-01
Colección:Crystals
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Acceso en línea:https://www.mdpi.com/2073-4352/12/7/989
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