Contrast Enhancement for Topographic Imaging in Confocal Laser Scanning Microscopy
The influence of the axial pinhole position in a confocal microscope in terms of the contrast of the image is analyzed. The pinhole displacement method is introduced which allows to increase the contrast for topographic imaging. To demonstrate this approach, the simulated data of a confocal setup as...
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| 主要な著者: | , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
MDPI AG
2019-07-01
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| シリーズ: | Applied Sciences |
| 主題: | |
| オンライン･アクセス: | https://www.mdpi.com/2076-3417/9/15/3086 |
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