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Guest Editorial Special Section on the Second Electron Devices Technology and Manufacturing (EDTM) Conference 2018

Performance improvement by simple device scaling is running out of steam. Design and Technology Co-Optimization (DTCO) and System and Technology Co-Optimization (STCO) are the hot topics to overcome scaling issues by collaboration among device, circuit, and system communities. Another approach is se...

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Principais autores: Kazunari Ishimaru, Naoto Horiguchi, Kazuo Nojiri, Paul Lining Zhang, Paul R. Berger
格式: Artigo
語言:Inglês
出版: IEEE 2018-01-01
叢編:IEEE Journal of the Electron Devices Society
在線閱讀:https://ieeexplore.ieee.org/document/8576496/
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