Photoconductivity Spectra of Amorphous Hydrogenated Silicon Films with Nanocrystalline Inclusions
The technique for the study of amorphous hydrogenated silicon films with nanocrystalline inclusions non-uniformly distributed through the thickness (pm-Si:H) deposited on glass substrates is devised. Photocurrent spectra for the films of various thicknesses are studied when illuminated from the free...
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| Principais autores: | , |
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| Formato: | Artigo |
| Idioma: | Russo |
| Publicado: |
Saint Petersburg Electrotechnical University "LETI"
2016-10-01
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| Series: | Известия высших учебных заведений России: Радиоэлектроника |
| Assuntos: | |
| Acceso en liña: | https://re.eltech.ru/jour/article/view/134 |
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