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Dual-frequency angular-multiplexed fringe projection profilometry with deep learning: breaking hardware limits for ultra-high-speed 3D imaging

Recent advancements in artificial intelligence have transformed three-dimensional (3D) optical imaging and metrology, enabling high-resolution and high-precision 3D surface geometry measurements from one single fringe pattern projection. However, the imaging speed of conventional fringe projection p...

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Principais autores: Wenwu Chen, Yifan Liu, Shijie Feng, Wei Yin, Jiaming Qian, Yixuan Li, Hang Zhang, Maciej Trusiak, Malgorzata Kujawinska, Qian Chen, Chao Zuo
Format: Artigo
Sprog:Inglês
Udgivet: Editorial Office of Opto-Electronic Journals Group, Institute of Optics and Electronics, CAS, China 2025-09-01
Serier:Opto-Electronic Advances
Fag:
3d imaging
fringe projection profilometry
deep learning
multiplex
ultra-high-speed
Online adgang:https://www.oejournal.org/article/doi/10.29026/oea.2025.250021
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