Single-exposure X-ray phase imaging microscopy with a grating interferometer
The advent of hard X-ray free-electron lasers enables nanoscopic X-ray imaging with sub-picosecond temporal resolution. X-ray grating interferometry offers a phase-sensitive full-field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is at...
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| Principais autores: | , , , , , , , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2022-05-01
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| coleção: | Journal of Synchrotron Radiation |
| Assuntos: | |
| Acesso em linha: | http://scripts.iucr.org/cgi-bin/paper?S160057752200193X |
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