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Trace-element analysis of mineral grains in Ryugu rock fragment sections by synchrotron-based confocal X-ray fluorescence

Abstract A fundamental parameter-based quantification scheme for confocal XRF was applied to sub-micron synchrotron radiation X-ray fluorescence (SR-XRF) data obtained at the beamline P06 of the Deutsches Elektronen-Synchrotron (DESY, Hamburg, Germany) from two sections C0033-01 and C0033-04 that we...

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Sábháilte in:
Príomhchruthaitheoirí: Benjamin Bazi, Pieter Tack, Miles Lindner, Bart Vekemans, Ella De Pauw, Beverley Tkalcec, Frank E. Brenker, Jan Garrevoet, Gerald Falkenberg, Hikaru Yabuta, Hisayoshi Yurimoto, Tomoki Nakamura, Kana Amano, Megumi Matsumoto, Yuri Fujioka, Yuma Enokido, Daisuke Nakashima, Masayuki Uesugi, Hiroshi Naraoka, Takaaki Noguchi, Ryuji Okazaki, Kanako Sakamoto, Toru Yada, Masahiro Nishimura, Aiko Nakato, Akiko Miyazaki, Kasumi Yogata, Masanao Abe, Tatsuaki Okada, Tomohiro Usui, Makoto Yoshikawa, Takanao Saiki, Satoshi Tanaka, Fuyuto Terui, Satoru Nakazawa, Shogo Tachibana, Sei-ichiro Watanabe, Yuichi Tsuda, Laszlo Vincze
Formáid: Artigo
Teanga:Inglês
Foilsithe / Cruthaithe: SpringerOpen 2022-11-01
Sraith:Earth, Planets and Space
Ábhair:
X-ray fluorescence
Confocal
Quantification
Fundamental parameter method
Ryugu
Hayabusa2
Rochtain ar líne:https://doi.org/10.1186/s40623-022-01726-y
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