Pixel-Wise Fabric Defect Detection by CNNs Without Labeled Training Data
Surface inspection is a necessary process of fabric quality control. However, it remains a challenging task owing to diverse types of defects, various patterns of fabric texture, and application requirements for detection speed. In this article, a lightweight deep learning model is therefore propose...
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| Hauptverfasser: | , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
IEEE
2020-01-01
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| Schriftenreihe: | IEEE Access |
| Schlagworte: | |
| Online-Zugang: | https://ieeexplore.ieee.org/document/9184894/ |
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