An Explainable Deep Learning Network With Transformer and Custom CNN for Bean Leaf Disease Classification

Bean rust and angular leaf spot pose significant challenges to bean cultivation, impacting yields. Prompt disease identification maximizes productivity, but traditional methods need specialized expertise. This research presents an explainable deep learning model that combines the Pyramid Vision Tran...

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書誌詳細

主要な著者:	R. Karthik, R. Aswin, K. S. Geetha, K. Suganthi
フォーマット:	Artigo
言語:	Inglês
出版事項:	IEEE 2025-01-01
シリーズ:	IEEE Access
主題:	Bean leaf diseases transformer CNN explainability
オンライン･アクセス:	https://ieeexplore.ieee.org/document/10904208/
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