A Systematical Characterization of TeO<sub>2</sub>–V<sub>2</sub>O<sub>5</sub> Glass System Using Boron (III) Oxide and Neodymium (III) Oxide Substitution: Resistance Behaviors against Ionizing Radiation
This study aimed to perform an extensive characterization of a 74.75TeO<sub>2</sub>–0.25V<sub>2</sub>O<sub>5</sub>–(25 − x)B<sub>2</sub>O<sub>3</sub>-xNd<sub>2</sub>O<sub>3</sub> glass system with (x = 0, 0.5, 1.0, and 1.5 mol%) for radiation shielding properties. Linear and mass attenuation coeffic...
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| Hauptverfasser: | , , , , , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
MDPI AG
2021-03-01
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| Schriftenreihe: | Applied Sciences |
| Schlagworte: | |
| Online-Zugang: | https://www.mdpi.com/2076-3417/11/7/3035 |
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