Band Offsets from Angle‐Resolved Valence Band Photoemission Spectroscopy
Abstract The conduction band offset ϕ0 at semiconductor surfaces and interfaces is a crucial parameter for quantum devices exploiting proximity‐induced collective states such as superconductivity and magnetism. Recently, a method combining angle‐resolved conduction band and core‐level photoelectron...
Gorde:
| Egile Nagusiak: | , , , , , , , , , , , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Wiley-VCH
2025-11-01
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| Saila: | Advanced Materials Interfaces |
| Gaiak: | |
| Sarrera elektronikoa: | https://doi.org/10.1002/admi.202500340 |
| Etiketak: |
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