Studies of Buried Layers and Interfaces of Tungsten Carbide Coatings on the MWCNT Surface by XPS and NEXAFS Spectroscopy

Currently, X-ray photoelectron spectroscopy (XPS) is widely used to characterize the nanostructured material surface. The ability to determine the atom distribution and chemical state with depth without the sample destruction is important for studying the internal structure of the coating layer seve...

Ausführliche Beschreibung

Bibliografische Detailangaben

Hauptverfasser:	Danil Sivkov, Sergey Nekipelov, Olga Petrova, Alexander Vinogradov, Alena Mingaleva, Sergey Isaenko, Pavel Makarov, Anatoly Ob’edkov, Boris Kaverin, Sergey Gusev, Ilya Vilkov, Artemiy Aborkin, Viktor Sivkov
Format:	Artigo
Sprache:	Inglês
Veröffentlicht:	MDPI AG 2020-07-01
Schriftenreihe:	Applied Sciences
Schlagworte:	XPS NEXAFS TEY MWCNT WC<sub>1-x</sub>/MWCNTs MOCVD
Online-Zugang:	https://www.mdpi.com/2076-3417/10/14/4736
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