An apple defect identification method based on improved YOLOv7-tiny
ObjectiveTo improve the accuracy of apple defect identification and classification.MethodsAn apple defect identification method based on improved YOLOv7-tiny is proposed. Firstly, a multi-angle image acquisition system is designed to sample and enhance the surface of the apple. Then, the YOLOv7-tiny...
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
The Editorial Office of Food and Machinery
2025-08-01
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| Edice: | Shipin yu jixie |
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| On-line přístup: | http://ifoodmm.com/spyjx/article/html/202508014?st=article_issue |
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