Microstructural Underpinnings of Giant Intrinsic Exchange Bias in Epitaxial NiCo2O4 Thin Films

Abstract Understanding intrinsic exchange bias in nominally single‐component ferromagnetic or ferrimagnetic materials is crucial for simplifying related device architectures. However, the mechanisms behind this phenomenon and its tunability remain elusive, which hinders the efforts to achieve unidir...

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Autores principales:	Detian Yang, Arjun Subedi, Chao Liu, Haile Ambaye, Valeria Lauter, Peter A. Dowben, Yaohua Liu, Xiaoshan Xu
Formato:	Artigo
Lenguaje:	Inglês
Publicado:	Wiley-VCH 2025-02-01
Colección:	Advanced Electronic Materials
Materias:	intrinsic exchange bias nickel cobaltate oxide thin films polarization neutron reflection X‐ray photoemission spectroscopy
Acceso en línea:	https://doi.org/10.1002/aelm.202400149
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