Aging Analysis of Semiconductive Silicone Rubber for 10 kV Cold-Shrink Cable Accessories

This study focuses on the semiconductive silicone rubber of 10 kV cold-shrink accessories. Accelerated thermal aging tests were conducted on the semiconductive silicone rubber, obtaining tensile stress–strain curves at various time points after thermal aging. The corresponding parameters of the Yeoh...

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Hlavní autoři:	Jun Yu, Zhijian Zhang, Weifeng Ren, Dongxing Yang, Dian Wu, Zhiqiang Ning, Chunhua Fang, Junxiong Wu
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	MDPI AG 2024-02-01
Edice:	Energies
Témata:	cold-shrink cable accessories semiconductive silicone rubber thermal aging aging mechanism
On-line přístup:	https://www.mdpi.com/1996-1073/17/3/708
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