Aging Analysis of Semiconductive Silicone Rubber for 10 kV Cold-Shrink Cable Accessories

This study focuses on the semiconductive silicone rubber of 10 kV cold-shrink accessories. Accelerated thermal aging tests were conducted on the semiconductive silicone rubber, obtaining tensile stress–strain curves at various time points after thermal aging. The corresponding parameters of the Yeoh...

Descripció completa

Dades bibliogràfiques

Autors principals:	Jun Yu, Zhijian Zhang, Weifeng Ren, Dongxing Yang, Dian Wu, Zhiqiang Ning, Chunhua Fang, Junxiong Wu
Format:	Artigo
Idioma:	Inglês
Publicat:	MDPI AG 2024-02-01
Col·lecció:	Energies
Matèries:	cold-shrink cable accessories semiconductive silicone rubber thermal aging aging mechanism
Accés en línia:	https://www.mdpi.com/1996-1073/17/3/708
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!