Broadband high-resolution X-ray ptychography system spanning tender to hard X-ray regimes

X-ray ptychography is a high-resolution imaging technique capable of resolving nanoscale structures and probing chemical states. However, despite advances, most conventional X-ray ptychography systems have been designed to operate within a single energy regime, such as hard (> 5 keV), soft (< 2 keV)...

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Detalhes bibliográficos

Principais autores:	Yuhei Sasaki, Nozomu Ishiguro, Masaki Abe, Shuntaro Takazawa, Hideshi Uematsu, Naru Okawa, Fusae Kaneko, Yukio Takahashi
Formato:	Artigo
Idioma:	Inglês
Publicado em:	International Union of Crystallography 2026-01-01
coleção:	IUCrJ
Assuntos:	tender/hard x-ray ptychography advanced kirkpatrick–baez focusing mirrors citius detectors x-ray spectromicroscopy nanoterasu
Acesso em linha:	https://journals.iucr.org/paper?S2052252525009236
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