Degradation Mechanisms in Metallized Barrier Films for Vacuum Insulation Panels Subjected to Flanging-Induced Stress

The long-term reliability of vacuum insulation panels (VIPs) is constrained by the barrier film degradation caused by micro-cracks during the flanging process. However, the correlation mechanism between process parameters and microleakage remains unclear. This study systematically investigates the i...

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Bibliografische Detailangaben

Hauptverfasser:	Juan Wang, Ziling Wang, Delei Chen, Zhibin Pei, Jian Shen, Ningning Zhou
Format:	Artigo
Sprache:	Inglês
Veröffentlicht:	MDPI AG 2025-08-01
Schriftenreihe:	Nanomaterials
Schlagworte:	vacuum insulation panels (VIPs) barrier film degradation flanging process micro-crack propagation metallized films
Online-Zugang:	https://www.mdpi.com/2079-4991/15/16/1231
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