Fault injection and failure analysis on Xilinx 16 nm FinFET Ultrascale+ MPSoC

Energetic particle strikes the device and induces data corruption in the configuration memory (CRAM), causing errors and even malfunctions in a system on chip (SoC). Software-based fault injection is a convenient way to assess device performance. In this paper, dynamic partial reconfiguration (DPR)...

Descripció completa

Dades bibliogràfiques

Autors principals:	Weitao Yang, Yonghong Li, Chaohui He
Format:	Artigo
Idioma:	Inglês
Publicat:	Elsevier 2022-06-01
Col·lecció:	Nuclear Engineering and Technology
Matèries:	Fault injection Failure analysis Ultrascale+ MPSoC Failure modes and effects analysis
Accés en línia:	http://www.sciencedirect.com/science/article/pii/S1738573321006914
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!