Broadband Dielectric Characterization of High-Permittivity Rogers Substrates via Terahertz Time-Domain Spectroscopy in Reflection Mode

We report the dielectric characterization of three commercially available, high-permittivity Rogers laminates in the sub-terahertz range, by means of terahertz time-domain spectroscopy measurements in reflection mode. A transmission-line model is developed to obtain the reflectance spectra as a func...

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Egile Nagusiak:	Walter Fuscaldo, Francesco Maita, Luca Maiolo, Romeo Beccherelli, Dimitrios C. Zografopoulos
Formatua:	Artigo
Hizkuntza:	Inglês
Argitaratua:	MDPI AG 2022-08-01
Saila:	Applied Sciences
Gaiak:	high-permittivity substrates Rogers laminates terahertz time-domain spectroscopy dielectric material characterization dielectric dispersion
Sarrera elektronikoa:	https://www.mdpi.com/2076-3417/12/16/8259
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