Broadband Dielectric Characterization of High-Permittivity Rogers Substrates via Terahertz Time-Domain Spectroscopy in Reflection Mode

We report the dielectric characterization of three commercially available, high-permittivity Rogers laminates in the sub-terahertz range, by means of terahertz time-domain spectroscopy measurements in reflection mode. A transmission-line model is developed to obtain the reflectance spectra as a func...

Descripció completa

Dades bibliogràfiques

Autors principals:	Walter Fuscaldo, Francesco Maita, Luca Maiolo, Romeo Beccherelli, Dimitrios C. Zografopoulos
Format:	Artigo
Idioma:	Inglês
Publicat:	MDPI AG 2022-08-01
Col·lecció:	Applied Sciences
Matèries:	high-permittivity substrates Rogers laminates terahertz time-domain spectroscopy dielectric material characterization dielectric dispersion
Accés en línia:	https://www.mdpi.com/2076-3417/12/16/8259
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!