Retrieving the size of particles with rough surfaces from 2D scattering patterns
Frequency analysis can be used for the recovery of particle properties such as size from scattering data, but is difficult to apply in practice, as lack of completeness or discontinuities at boundaries can produce artifacts. For 2D scattering patterns image processing, including morphological operat...
-д хадгалсан:
| Үндсэн зохиолчид: | , , , |
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| Формат: | Artigo |
| Хэл сонгох: | Inglês |
| Хэвлэсэн: |
Accademia Peloritana dei Pericolanti
2011-09-01
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| Цуврал: | Atti della Accademia Peloritana dei Pericolanti : Classe di Scienze Fisiche, Matematiche e Naturali |
| Онлайн хандалт: | http://dx.doi.org/10.1478/C1V89S1P087 |
| Шошгууд: |
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
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