Retrieving the size of particles with rough surfaces from 2D scattering patterns
Frequency analysis can be used for the recovery of particle properties such as size from scattering data, but is difficult to apply in practice, as lack of completeness or discontinuities at boundaries can produce artifacts. For 2D scattering patterns image processing, including morphological operat...
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| Autors principals: | , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Accademia Peloritana dei Pericolanti
2011-09-01
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| Col·lecció: | Atti della Accademia Peloritana dei Pericolanti : Classe di Scienze Fisiche, Matematiche e Naturali |
| Accés en línia: | http://dx.doi.org/10.1478/C1V89S1P087 |
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