Nonlinear reflection ellipsmetry for an anisotropic uniaxial crystal then optical axis lies in the plane of incidence
A new method of ellipsometry was considered Nonlinear ellipsometry, allowing to determine nonlinear characteristic of a medium. Angular spectra of nonlinear reflection ellipsometry for uniaxial crystals such as Beta-Barium Borate, Lithium Niobate, Proustite were calculated and plotted at different...
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| Principais autores: | , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Povolzhskiy State University of Telecommunications & Informatics
2013-01-01
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| coleção: | Физика волновых процессов и радиотехнические системы |
| Assuntos: | |
| Acesso em linha: | https://journals.ssau.ru/pwp/article/viewFile/7383/7242 |
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