High-luminosity meV-resolution single-shot hard X-ray spectrograph for cavity-based X-ray free-electron lasers

Cavity-based X-ray free-electron lasers (CBXFELs) represent a possible realization of fully coherent hard X-ray sources having high spectral brilliance along with a narrow spectral bandwidth of ∼1–50 meV, a high repetition pulse rate of ∼1 MHz, and good stability. A diagnostic tool is required to me...

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מידע ביבליוגרפי

Principais autores:	Keshab Kauchha, Peifan Liu, Paresh Pradhan, Yuri Shvyd'ko
פורמט:	Artigo
שפה:	Inglês
יצא לאור:	International Union of Crystallography 2025-07-01
סדרה:	Journal of Synchrotron Radiation
נושאים:	x-rays bragg diffraction angular dispersion spectrograph cavity-based xfels
גישה מקוונת:	https://journals.iucr.org/paper?S1600577525004278
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