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Centimeter-Scale Roughness Characteristics of Lunar Geological Structures and Permanently Shadowed Regions: Insights From Mini-RF SAR Data

Topographic roughness is a critical parameter in lunar exploration and scientific research due to its scale-dependent properties. Synthetic aperture radar (SAR) is a powerful tool for characterizing lunar surface physical properties. This study investigates the centimeter-scale roughness characteris...

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Autores principales: Yao Gao, Bo Wu, Jiapei Hu, Yi Xu, Fei Zhao, Zihan Xu, Pingping Lu, Robert Wang
Formato: Artigo
Lenguaje:Inglês
Publicado: IEEE 2026-01-01
Colección:IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
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Acceso en línea:https://ieeexplore.ieee.org/document/11397366/
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