Mechanical Modulation of Phonon-Assisted Field Emission in a Silicon Nanomembrane Detector for Time-of-Flight Mass Spectrometry

We demonstrate mechanical modulation of phonon-assisted field emission in a free-standing silicon nanomembrane detector for time-of-flight mass spectrometry of proteins. The impacts of ion bombardment on the silicon nanomembrane have been explored in both mechanical and electrical points of view. Lo...

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Bibliografski detalji

Glavni autori:	Jonghoo Park, Robert H. Blick
Format:	Artigo
Jezik:	Inglês
Izdano:	MDPI AG 2016-02-01
Serija:	Sensors
Teme:	NEMS MALDI TOF silicon nanomembrane mass spectrometry phonon ion detector
Online pristup:	http://www.mdpi.com/1424-8220/16/2/200
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